Microscopy & Microanalysis 2022
Booth #2071

For every researcher, there is that moment of discovery. By working with our customers to develop new approaches, Gatan and EDAX believe there are endless opportunities to explore the boundaries of electron microscopy and uncover new insights into your research.


Visit our booth (#2071) during M&M 2022 to discover together how to achieve your next breakthrough with our newest products.



The cutting-edge counting camera for groundbreaking imaging, diffraction, and in-situ studies. 

Velocity Ultra

The world’s fastest EBSD detector for routine, 3D, and in-situ materials characterization.



The first and only system that quantitatively reveals the distribution of lithium in conventional scanning electron microscopes.


The world’s first direct detection camera to democratize cryo-electron microscopy (cryo-EM). 

APEX 3.0

Streamlined microanalysis with the advanced analytical power for EDS, EBSD, and WDS.


Reserve time with the Gatan and EDAX teams to experience how our state-of-the-art solutions can address your most challenging applications. Sessions are hosted in the booth (#2071) and will connect you with an industry specialist who will demonstrate hardware via a live-remote microscope session.

Request a Demo


Metro Counting Camera Velocity Ultra EBSD System
GIF Continuum K3 with Stela System* Alpine Direct Detection Camera
Additional demonstrations
  • EDAX EDS Powered by Gatan
  • Stela Hybrid-Pixel Camera*
  • OneView Camera
  • Rio Camera
  • STEMx 4D STEM Diffraction
  • Latitude Software Series

*Utilizes DECTRIS hybrid-pixel technology

  • Clarity EBSD Camera Series
  • Octane Elite EDS System
  • Pegasus EBSD-EDS Systems
  • OIM Analysis
  • APEX Software
  • DigitalMicrograph Software


Join us in the Gatan and EDAX booth (#2071) to learn about the new products and applications that can help you achieve your next breakthrough. 

Monday, August 1

12:30 – 1:00 p.m.

DigitalMicrograph: A multifaceted platform for advanced electron diffraction studies
Ana Pakzad

1:00 – 1:30 p.m.

Optimized detectors for EELS and EFTEM
Ray Twesten and Liam Spillane

Tuesday, August 2

12:30 – 1:00 p.m.

Cutting-edge EBSD detector technology
Matt Nowell

1:00 – 1:30 p.m.

Integrating new in-situ capabilities and techniques in DigitalMicrograph
Cory Czarnik

Wednesday, August 3

12:30 – 1:00 p.m.

Recharge your lithium research – Workflow and tools for the characterization of lithium-ion batteries
David Stowe

1:00 – 1:30 p.m.

Alpine – the World’s First Direct Detection Camera to Democratize Cryo-EM
Stephen Mick


Gain in-depth knowledge about techniques and analyses that can help advance your research. All presentations are in the Gatan and EDAX booth (#2071) from 5:45 – 6:45 p.m. each day. Attendees must pre-register at MSA Mega Booth #908. Space is limited. 

Monday, August 1

Metro: Extending counting and direct detection to everyday imaging, in-situ, and diffraction
Cory Czarnik

Tuesday, August 2

Get more from your EBSD data with OIM Analysis
Matt Nowell


Latitude D: An automated solution for continuous diffraction tomography/MicroED data collection
Sahil Gulati

Wednesday, August 3

Multimodal data analysis in DigitalMicrograph – Analyzing image, diffraction, and spectroscopy data on a single software platform
Liam Spillane


Monday, August 1

3:00 – 5:00 p.m.

The promises when WDS supports the EDS x-ray analysis in SEM and the evaluation algorithms do merge
Frank Eggert (A05.P1, Poster 809)

Tuesday, August 2

9:30 – 9:45 a.m.

Electron beam damage mechanisms in solution phase electron microscopy of metal-organic frameworks
Karthikeyan Gnanasekaran, Northwestern University (P08.2, Presentation 588)

9:45 – 10:00 a.m.

On the accuracy of the composition-by-difference method for determining lithium content in oxides
Dr. Jonathan Lee (A05.2, Presentation 113)

11:00 – 11:15 a.m.

SEM-EDS mapping of ultra-low energy x-rays using a silicon nitride window silicon drift detector
Dr. Shangshang Mu (A05.3, Presentation 115)

2:15 – 2:30 p.m.

Large-format direct detection camera for cryo-EM at 100 keV
Dr. Stephen Mick (B03.1, Presentation 248)

2:30 – 2:45 p.m.

Electron counted STEM-EELS spectroscopy optimized for low kV (<80 kV) via hybrid-pixel detection
Liam Spillane (P08.4, Presentation 598)

3:00 – 5:00 p.m.

Extensible real-time data processing with Python in DigitalMicrograph
Cory Czarnik (A02.P2, Poster 014)

3:00 – 5:00 p.m.

Electron backscatter diffraction analysis of beam-sensitive samples using direct detection technology
Matt Nowell (P08.P2, Poster 1003)

3:00 – 5:00 p.m.

In-situ ETEM reveals formation mechanism of single Pt atom on Ru nanoparticle electrocatalysts for CO-resilient methanol oxidation
Agus R. Poerwoprajitno, University of New South Wales (A02.P2, Poster 015)

Wednesday, August 3

8:30 – 9:00 a.m.

The performance of detectors for diffraction-based studies in (S)TEM
Ana Pakzad / Robert dos Ries, Northwestern University (C05.1, Presentation 428)

10:30 – 10:45 a.m.

Probing sources of decoherence at defects and interfaces in superconducting quantum materials and devices
Akshay Murthy, Northwestern University (P02.6, Presentation 477)

11:15 – 11:30 a.m.

Melting of polar vortex arrays in an oxide superlattice probed by in-situ STEM EELS
Noah Schnitzer, Cornell University (P09.6, Presentation 635)

11:45 a.m. – 12:00 p.m.

Detecting and characterizing the fluxionality in Pt nanoparticles
Advait Gilankar, Arizona State University (A02.5, Presentation 45)

Thursday, August 4

9:15 – 10 a.m.

Automated spectrum imaging using hybridized DM script and Python code in DigitalMicrograph
Liam Spillane (C01.2, Presentation 373)

10:00 a.m. – 12:00 p.m.

Towards spatial mapping of atomic vibration amplitudes in thermoelectric materials: Quantitative convergent beam electron diffraction (QCBED) study of BiCuOQ (Q = S, Se, Te)
Yukun Liu, Northwestern University (A04.P3, Poster 803)

1:45 – 2:00 p.m.

Multimodal and correlative characterization of hybrid structures: Application to materials for environmental remediation
Stephanie Ribet, Northwestern University (B04.2, Presentation 289)

4:00 – 4:15 p.m.

Probing optical phenomena of Si@MoS2 core-shell architectures at nanoscale by valence EELS
Yea-Shine Lee, Northwestern University (P06.4, Presentation 544)