For every researcher, there is that moment of discovery. By working with our customers to develop new approaches, Gatan and EDAX believe there are endless opportunities to explore the boundaries of electron microscopy and uncover new insights into your research.
Visit our booth (#2071) during M&M 2022 to discover together how to achieve your next breakthrough with our newest products.
Reserve time with the Gatan and EDAX teams to experience how our state-of-the-art solutions can address your most challenging applications. Sessions are hosted in the booth (#2071) and will connect you with an industry specialist who will demonstrate hardware via a live-remote microscope session.
Request a Demo |
![]() |
![]() |
Metro Counting Camera | Velocity Ultra EBSD System |
![]() |
![]() |
GIF Continuum K3 with Stela System* | Alpine Direct Detection Camera |
Additional demonstrations
|
|
*Utilizes DECTRIS hybrid-pixel technology |
|
Join us in the Gatan and EDAX booth (#2071) to learn about the new products and applications that can help you achieve your next breakthrough.
Monday, August 1 |
|
12:30 – 1:00 p.m. |
DigitalMicrograph: A multifaceted platform for advanced electron diffraction studies |
1:00 – 1:30 p.m. |
Optimized detectors for EELS and EFTEM |
Tuesday, August 2 |
|
12:30 – 1:00 p.m. |
Cutting-edge EBSD detector technology |
1:00 – 1:30 p.m. |
Integrating new in-situ capabilities and techniques in DigitalMicrograph |
Wednesday, August 3 |
|
12:30 – 1:00 p.m. |
Recharge your lithium research – Workflow and tools for the characterization of lithium-ion batteries |
1:00 – 1:30 p.m. |
Alpine – the World’s First Direct Detection Camera to Democratize Cryo-EM |
Gain in-depth knowledge about techniques and analyses that can help advance your research. All presentations are in the Gatan and EDAX booth (#2071) from 5:45 – 6:45 p.m. each day. Attendees must pre-register at MSA Mega Booth #908. Space is limited.
Monday, August 1 |
Metro: Extending counting and direct detection to everyday imaging, in-situ, and diffraction |
Tuesday, August 2 |
Get more from your EBSD data with OIM Analysis |
Latitude D: An automated solution for continuous diffraction tomography/MicroED data collection |
|
Wednesday, August 3 |
Multimodal data analysis in DigitalMicrograph – Analyzing image, diffraction, and spectroscopy data on a single software platform |
Monday, August 1 |
|
3:00 – 5:00 p.m. |
The promises when WDS supports the EDS x-ray analysis in SEM and the evaluation algorithms do merge |
Tuesday, August 2 |
|
9:30 – 9:45 a.m. |
Electron beam damage mechanisms in solution phase electron microscopy of metal-organic frameworks |
9:45 – 10:00 a.m. |
On the accuracy of the composition-by-difference method for determining lithium content in oxides |
11:00 – 11:15 a.m. |
SEM-EDS mapping of ultra-low energy x-rays using a silicon nitride window silicon drift detector |
2:15 – 2:30 p.m. |
Large-format direct detection camera for cryo-EM at 100 keV |
2:30 – 2:45 p.m. |
Electron counted STEM-EELS spectroscopy optimized for low kV (<80 kV) via hybrid-pixel detection |
3:00 – 5:00 p.m. |
Extensible real-time data processing with Python in DigitalMicrograph |
3:00 – 5:00 p.m. |
Electron backscatter diffraction analysis of beam-sensitive samples using direct detection technology |
3:00 – 5:00 p.m. |
In-situ ETEM reveals formation mechanism of single Pt atom on Ru nanoparticle electrocatalysts for CO-resilient methanol oxidation |
Wednesday, August 3 |
|
8:30 – 9:00 a.m. |
The performance of detectors for diffraction-based studies in (S)TEM |
10:30 – 10:45 a.m. |
Probing sources of decoherence at defects and interfaces in superconducting quantum materials and devices |
11:15 – 11:30 a.m. |
Melting of polar vortex arrays in an oxide superlattice probed by in-situ STEM EELS |
11:45 a.m. – 12:00 p.m. |
Detecting and characterizing the fluxionality in Pt nanoparticles |
Thursday, August 4 |
|
9:15 – 10 a.m. |
Automated spectrum imaging using hybridized DM script and Python code in DigitalMicrograph |
10:00 a.m. – 12:00 p.m. |
Towards spatial mapping of atomic vibration amplitudes in thermoelectric materials: Quantitative convergent beam electron diffraction (QCBED) study of BiCuOQ (Q = S, Se, Te) |
1:45 – 2:00 p.m. |
Multimodal and correlative characterization of hybrid structures: Application to materials for environmental remediation |
4:00 – 4:15 p.m. |
Probing optical phenomena of Si@MoS2 core-shell architectures at nanoscale by valence EELS |