European Microscopy Congress (EMC) 2024
Stand B11
60 Years of Discovery
Celebrating 60 years of electron microscopy excellence, our journey has been one of relentless exploration and discovery. From unveiling intricate structures to driving technological breakthroughs, we have shaped scientific understanding. As we mark this milestone, we reaffirm our commitment to pioneering exploration, igniting curiosity, and inspiring innovation for the decades ahead.
DEMONSTRATIONS
Reserve time with the Gatan product management and applications teams in stand B11 to experience how our state-of-the-art solutions can address your most challenging applications. All SEM demos will performed live at the show on a TESCAN Mira microscope equipped with an EDAX Octane Elite Super EDS detector and Velocity™ Ultra EBSD camera.
| Request a Demo |
Group demoNSTRATIONS
Register for a group demonstration in the Gatan stand (B11) with our team at the times listed below. The group demonstrations consist of a 20-minute presentation followed by a 40-minute demonstration. Participants may attend part or all of the 60-minute demonstration.
| Monday, 26 August | |
| 15:00 – 16:00 | The power of spherical indexing and its future in EBSD René de Kloe |
| Tuesday, 27 August | |
| 11:00 – 12:00 | 4D STEM analysis with STEMx and eaSI technology Fernando Castro |
| 15:00 – 16:00 | Unlocking the power of EDS analysis: Expert strategies and tools Julia Mausz |
| Wednesday, 28 August | |
| 11:00 – 12:00 | Chemistry, composition, and crystallography with the GIF Continuum Liam Spillane |
| 15:00 – 16:00 | EBSD data acquisition and fully automated analysis/reports with OIM Analysis 9 René de Kloe |
| Thursday, 29 August | |
| 11:00 – 12:00 | Getting the most from your microscope with Metro series counting cameras Ben Miller |
| 15:00 – 16:00 | EDS analysis in APEX 3.0 and improved light elements performance Julia Mausz |
One-on-one demonstrations
Register for a one-on-one, virtual, or in-person demonstration with our team in Gatan stand B11. We are offering one-on-one demos for the following products:
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SEM
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TEM
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Note, all TEM demonstrations are compatible with eaSI® Technology.
*Utilizes DECTRIS hybrid-pixel electron technology
Flash Presentation
Gain in-depth knowledge about techniques and analyses that can help advance your research. The presentation will be held in lecture hall 4.
| Wednesday, 28 August | |
| 13:30 – 13:50 | Make every electron count: New tools for improved analytical performance Ray Twesten |
POSTERS and PRESENTATIONS
| Monday – Tuesday, 26 – 27 August | |
| 16:00 – 18:00 | Maximizing speed and sensitivity: Simultaneous high-throughput EDS-WDS elemental mapping in the SEM Shangshang Mu (IM-05, Poster 249) |
| 16:00 – 18:00 | Continuous EELS spectrum imaging of nano-droplet crystallization heterogeneity Ben Miller (IM-07, Poster 235) |
| 16:00 – 18:00 | Investigating multiferroic phase change dynamics using in-situ electron counted spectrum imaging with synchronized holder control Liam Spillane (PS-08, Poster 248) |
| Wednesday – Thursday, 28 – 29 August | |
| 16:00 – 18:00 | Evaluating spherical models of EBSD patterns for forward modelling indexing René de Kloe (IM-06, Poster 726) |
| 16:00 – 18:00 | Gigabytes to megabytes – Rapidly analyzing in-situ videos to track lattice spacing changes Ben Miller (IM-06, Poster 229) |
| 16:00 – 18:00 | Detection of weak ELNES signals using dose-fractionated spectrum imaging combined with direct detection Andrew Thron (PS-05, Poster 350) |
| Thursday, 29 August | |
| 14:00 – 16:00 | Investigating all-inorganic halide perovskite phase transformations via in-situ 4D STEM heating experiments Fernando Castro and Roberto do Reis, Northwestern University (PS-03, Presentation 245) |