Workshop on SEM sample preparation and EBSD analysis techniques

Date: May 25, 2023 (9 a.m. – 5 p.m. CEST)
Location: Unterschleissheim, Germany

Are you interested in finding out how to collect the best electron backscatter diffraction (EBSD) data at the fastest speeds? Gatan would like to invite you to attend our upcoming workshop focusing on EBSD sample preparation and analysis.

The workshop will include scientific presentations about scanning electron microscope (SEM) sample preparation and EBSD acquisition and analysis techniques given by experts from Gatan and invited speakers from the scientific community. In addition, application scientists from Gatan will demonstrate these techniques live with the PECS™ II broad argon ion beam system for sample preparation, the EDAX Velocity™ Ultra EBSD system, the world's fastest EBSD detector with speeds up to 6,700 indexed points per second, and EDAX OIM Matrix™ software package.

Registration is free for this one-day event, but seats are limited. If interested, please register at the link below to reserve your seat until April 30. The workshop agenda will be available later in April. If you have any questions, please get in touch with

We look forward to seeing you at the workshop.




(left) Secondary electron image and (center) EBSD IPF on IQ map of a crack exposed by the ion milling with the PECS II system on a Mg sample. (right) Detail of Mg grain with twin lamellae.